There are many kinds of reliability test methods for electronic products. Here are some common methods.
The first method is the "Test - Problem Record - Retest" mode. This method is based on the failure mechanism of various failure modes. It is not the immediate improvement of the products that are initially developed. When the problems are discovered, the problems are not recorded immediately. Instead, the problems are recorded until the end of a test phase and before the start of the next phase. Make improvements and then test again. With this test method, product reliability will have a greater leap forward. This test method is more suitable for use in a batch of testing machines. There are several problems. One of the problems is the predominant status while the remaining problems are minor.
The second method is the "test-improvement-retest" mode. The method is to analyze the failure modes and failure mechanisms of the products that have been initially developed through tests and expose the weak points of the products. Immediately improve the problem by identifying the problem, and then test and verify the problem solved to increase the reliability of the product. . This method is used in the electronic product development stage, through system testing, after revealing product weaknesses, according to the specific circumstances, the immediate necessary improvement is to enable the product's reliability to have a substantial increase, this method is more suitable for testing Only a relatively common and serious problem has emerged, and it is more targeted.
The third method is "with delay improvement test-improvement-retest" mode. This method combines Method One with Method Two. The problem of the product is discovered through testing. Some of the improvements involve product problems during the test. Some of the improvements are immediately initiated in the test, and some are delayed until the end of the test. During the test, we shall immediately take measures to improve the product and improve the reliability of the problem that can be promptly improved. After the end of the test period, we will improve the problem of delay until the next test, and then carry out tests to make the product more reliable. Get bigger growth. This method is more suitable for the emergence of several problems in the test, and some problems can be easily improved in the short term, and other problems require a considerable period of time to improve the comprehensive situation.
For the three methods described above, electronic products are subjected to systematic tests in the development stage, and specific analysis of the exposed problems is required for flexible application. The three methods commonly used in reliability tests are often cycled cyclically, and the reliability of one cycle is higher than that of a cycle product. In addition to the reliability test, the system tests must also pass the climatic environment test and machinery according to the specific conditions. Environmental testing and human normal use and other aspects of the test to expose the weak links of product production, comprehensive scientific analysis, and make corresponding improvements, so that electronic products in the design and development phase of its inherent reliability has further improved. Conclusion The reliability of electronic products is very important and is the main indicator of product quality.
China's electronic instrument reliability test follows the standard GB11463 "Electronic Measurement Instrument Reliability Test". The reliability index of the general product during the evaluation is 300H. If the reliability test is performed according to the commonly used time-table censoring scheme, the total test is conducted. Time to reach around 10000H. Since the electronic products have undergone repeated tests of "test-analysis-improvement-retest" at the design and development stage, the reliability growth test process has progressed. In this process, due to the adoption of a series of measures such as improved design and technological measures to eliminate failures, the occurrence of failures is gradually reduced, and reliability is increased. There are still gaps in the reliability indices of some electronic products in China compared with international advanced standards. Therefore, it is necessary to fully study the relevant standards at home and abroad.
Accurately evaluate the reliability level from the whole process of demonstration, design, production, testing and use of product solutions, thereby greatly improving the reliability level of electronic products in China, and making the product quality reach the world advanced level.