Oscilloscope detection and analysis of electrical fast transient events

You can also detect the "short" pulse caused by the EFT event and finally calculate the energy of an EFT pulse. With this information, the design can be modified to improve anti-EFT interference performance. EFT events occur when the current is momentarily interrupted, creating an arcing between the contacts, which can damage the circuit and system. The electromagnetic field generated by the arc is coupled into the circuit path through cables, traces, and connectors. Common causes of EFT events include relay contact bounce, circuit breaker opening and closing, inductive load switching, and equipment power down. The breakdown of the air gap between the electrical contacts also often triggers a rapid burst of EFT pulses.

Sequential capture

To capture a series of fast pulses (such as EFT pulses) or narrow-length events (such as EFT bursts), sequential acquisition is an ideal method. In sequential capture mode, the oscilloscope can display a complete waveform consisting of many fixed-size segments. The sequential acquisition function can be initiated by setting the desired number of segments, the maximum segment length, and the total available memory. These parameters determine the actual number of events the oscilloscope can capture.

The sequential time base mode has a double benefit for EFT analysis because it allows fine-grained capture of complex sequence of events with long time intervals while ignoring the useless period between events (long interval). You can use a high-accuracy acquisition time base to make timing measurements of selected segments between events. Figure 1 shows a sequential time base capture operation diagram.

Oscilloscope detection and analysis of electrical fast transient events

Figure 1: Sequential timebase acquisition operations eliminate "useless" time between target events

Sequential time base capture automatically captures the timestamp of each segment to help confirm the frequency of EFT burst events. In addition, sequential timebase mode uses advanced triggering techniques to isolate rare events, which can detect erroneous EFT pulse shapes.

Figure 2 shows a series of EFT bursts acquired in segments in sequential acquisition mode. Note that the sequential capture process eliminates the long interval between bursts, leaving only the burst waveforms needed for acquisition. Each burst has timestamp information, including the date and time of the acquisition, the start of the sequence, and the segmentation interval of the corresponding EFT burst interval.

Oscilloscope detection and analysis of electrical fast transient events

Figure 2: Sequential capture mode allows the oscilloscope to display EFT bursts that are acquired in time-stamped segments

In contrast, Figure 3 shows the EFT pulse instead of the burst acquired as a segment.

Oscilloscope detection and analysis of electrical fast transient events

Figure 3: The oscilloscope captures EFT pulses and marks them as segments by timestamp

An oscilloscope can actually capture thousands of pulses. It should be noted that the time scale for sequential burst capture is 2 ms per division (corresponding to a time capture window of 20 ms), while the time scale for sequential pulse capture is 100 ns per division (corresponding to a time capture window of 1 μs).

The inter-segment timestamp in EFT burst capture mode shows that the interval between bursts is approximately 100 ms, while the inter-segment timestamp in EFT pulse capture mode shows that the interval between pulses is approximately 100 μs. The time scales of the two captures differ by a factor of 1,000, highlighting the different characteristics of a single EFT pulse and an EFT pulse train.

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